Methods and apparatus for deriving thermal flux data for...

Details Methods and apparatus for deriving thermal flux data for... Methods and apparatus for deriving thermal flux data for...

2005-06-14

2005-06-14

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S099000, C702S130000, C702S136000, C700S121000

Reexamination Certificate

active

06907364

ABSTRACT:
Presented are methods, systems, and apparatus for deriving heat flux information and using heat flux information for a workpiece used in temperature sensitive processes.

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U.S. Appl. No. 60/285,439, filed Apr. 19, 2001.
U.S. Appl. No. 60/411,357, filed Sep. 16, 2002.

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