Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2007-01-23
2007-01-23
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C702S058000, C702S108000, C702S183000, C703S002000, C716S030000, C716S030000, C324S765010, C324S076110, C700S095000, C700S121000
Reexamination Certificate
active
10367355
ABSTRACT:
A method and apparatus for testing semiconductors according to various aspects of the present invention comprises a test system comprising composite data analysis element configured to analyze data from more than one dataset. The test system may be configured to provide the data in an output report. The composite data analysis element suitably performs a spatial analysis to identify patterns and irregularities in the composite data set. The composite data analysis element may also operate in conjunction with a various other analysis systems, such as a cluster detection system and an exclusion system, to refine the composite data analysis. The composite may also be merged into other data.
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Desta Elias
Hoff Marc S.
Noblitt & Gilmore LLC
Test Advantage, Inc.
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