Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-09-20
2005-09-20
Smith, Matthew (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
06948140
ABSTRACT:
Disclosed are methods and apparatus for characterizing board test coverage. In one method, potentially defective properties are enumerated for a board, without regard for how the potentially defective properties might be tested. For each potentially defective property enumerated, a property score is generated. Each property score is indicative of whether a test suite tests for a potentially defective property. Property scores are then combined to characterize board test coverage for the test suite.
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Hird Kathleen J.
Parker Kenneth P.
Ramos Erik A.
Agilent Technologie,s Inc.
Smith Matthew
Tat Binh
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