Methods and apparatus for automatic test component...

Details Methods and apparatus for automatic test component... Methods and apparatus for automatic test component...

2007-05-29

2007-05-29

Chiang, Jack (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C703S014000, C703S015000, C703S016000

Reexamination Certificate

active

10869174

ABSTRACT:
Methods and apparatus are provided for efficiently generating test components for testing and evaluating a design under test. As a design is being configured, generated test components are made available. In one example, test components are automatically generated and included in a simulation testbench based on selected components in the design. Generally, the test components complement the selected components in the design. Moreover, the test components can be automatically seeded with initial contents.

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patent: 2003/0182641 (2003-09-01), Yang
patent: 2003/0225560 (2003-12-01), Garcia et al.
Simulating Nios Embedded Processor Designs, Altera Application Note 189, Ver. 2.1, Feb. 2003 (pp. 1-30).

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