Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-02-21
2006-02-21
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07003742
ABSTRACT:
A method for analyzing an integrated circuit (IC) having at least one of the group consisting of digital and analog components, where the IC is designed to meet a plurality of circuit performance specifications, and fabrication of the IC is monitored by measuring process factors and a previously defined set of electrical test variables. A set of linearly independent electrical test parameters are formed based on a subset of the set of electrical test variables. The set of process factors is mapped to the linearly independent electrical test parameters. A plurality of figure-of-merit (FOM) performance models are formed based on the process factors. The FOM models are combined with the mapping to enable modeling of IC performance based on the linearly independent electrical test parameters.
REFERENCES:
patent: 6038197 (2000-03-01), Sitton et al.
patent: 6259389 (2001-07-01), McGrath
patent: 6288776 (2001-09-01), Cahill et al.
patent: 6374204 (2002-04-01), Mandell et al.
patent: 6506983 (2003-01-01), Babb et al.
patent: 6678319 (2004-01-01), Jamali
Why is experimental design important for process modeling?, Engineering Statistics Handbook, pp 1-5; www:itl.nist.gov/div898/handbook/pmd/section3/pmd32.htm, Dec. 6, 2002.
What are some general design principles for process modeling?, Engineering Statistics Handbook, pp 1-5, www:itl.nist.gov/div898/handbook/pmd/section3/pmd33.htm, Dec. 6, 2002.
Wu, Cheng-Wen, Lab for Reliable Computing (LaRC),EE, NTHU, 2002, Chapter 1, Introduction, pp 1-17.
Gifford, David, Computational functional genomics, (Spring 2001; Lecture 9), pp 1-20.
Neddermeijer et al., A Framework for Response Surface Methodology for Simulation Optimization, Proceedings of the 2000 Winter Simulation Conference, pp 1-8.
Chemometrics, Unit 4, Response Surface Methodology, date unknown.
Daldoss Lidia
Guardiani Carlo
McNamara Patrick D.
Saxena Sharad
Dinh Paul
Duane Morris LLP
Koffs Steven E.
PDF Solutions, Inc.
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