Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-01-26
2009-11-10
Nghiem, Michael P. (Department: 2863)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
Reexamination Certificate
active
07617065
ABSTRACT:
A method for estimating statistical distribution characteristics of physical parameters of a semiconductor device includes manufacturing a plurality of semiconductor device chips, each having a plurality of transistors, preparing electrical characteristic data by measuring electrical characteristics of the plurality of transistors included in the plurality of chips, extracting an inter-chip distribution characteristic and an intra-chip distribution characteristic of the electrical characteristics by analyzing the electrical characteristic data, generating random number data satisfying the extracted inter-chip and intra-chip distribution characteristics, and performing a simulation for extracting statistical distribution characteristic data of the physical parameters of the chips, based on the random number data.
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Doh Ji-Seong
Kim Dae-Wook
Lee Jong-Bae
Lee Sang-Hoon
Yoo Moon-Hyun
Khuu Cindy H
Mills & Onello LLP
Nghiem Michael P.
Samsung Electronics Co,. Ltd.
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