Electronic digital logic circuitry – Reliability – Parasitic prevention in integrated circuit structure
Reexamination Certificate
2011-05-17
2011-05-17
Barnie, Rexford N (Department: 2819)
Electronic digital logic circuitry
Reliability
Parasitic prevention in integrated circuit structure
C326S014000, C326S026000
Reexamination Certificate
active
07944230
ABSTRACT:
The present invention includes a circuit-level system and method for preventing the propagation of soft errors in logic cells. A radiation jammer circuit in accordance with the present invention, including an RC differentiator and a depletion mode MOS circuit, when inserted at the output of a logic cell, significantly reduces the propagation of transient glitches. The radiation jammer circuit is a novel transistor-level optimization technique, which has been used to reduce soft errors in a logic circuit. A method to insert radiation jammer cells on selective nodes in a logic circuit for low overheads in terms of delay, power, and area is also introduced.
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Bhattacharya Koustav
Ranganathan Nagarajan
Barnie Rexford N
Sauter Molly L.
Smith & Hopen , P.A.
Tran Thienvu V
University of South Florida
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