Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-08-02
2005-08-02
Thompson, A. M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C324S076550, C324S512000, C324S645000, C438S014000, C438S484000
Reexamination Certificate
active
06925616
ABSTRACT:
A method for testing a core power distribution system for an integrated circuit chip which includes arranging a plurality of experiments for an integrated circuit chip, performing the plurality of experiments for the integrated circuit chip over a range of frequencies over a range of power distribution system impedances, generating a schmoo diagram for each of the plurality of experiments, and analyzing the schmoo diagrams to determine whether the core power distribution system functions is acceptable at a particular frequency.
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Noujeim Leesa
Sen Bidyut K.
Hamilton & Terrile LLP
Rossoshek Helen
Sun Microsystems Inc.
Terrile Stephen A.
Thompson A. M.
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