Method to improve yield and simplify operation of polymer...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S040000, C257SE27078, C257SE29300, C438S003000, C438S082000, C438S099000

Reexamination Certificate

active

07122853

ABSTRACT:
Systems and methodologies are provided for simplifying a polymer memory cell's operation by employing a post polymer growth treatment to form ionic or super ionic metal compounds therein. Such post polymer growth treatment facilitates distribution and mobility of metal ions (or charged metallic molecules) within an active layer of the polymer memory cell, and mitigates (or eliminates) a need for initialization procedures. Moreover, the post treatment of the present invention can also facilitate controlling a distribution of various thresholds (e.g., write and erase threshold), and set them to predetermined values Accordingly, variability in threshold values of polymer memory cells that can result from initialization processes can be mitigated (or eliminated), and thicker polymer layers can be employed without an initialization penalty.

REFERENCES:
patent: 6982188 (2006-01-01), Xie et al.
patent: 2003/0082444 (2003-05-01), Kuhr et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method to improve yield and simplify operation of polymer... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method to improve yield and simplify operation of polymer..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method to improve yield and simplify operation of polymer... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3691198

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.