Method to identify timing violations outside of...

Details Method to identify timing violations outside of... Method to identify timing violations outside of...

2008-03-11

2010-11-30

Rossoshek, Helen (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

07844932

ABSTRACT:
A method of evaluating an integrated circuit design selects manufacturing parameters of interest which are outside of manufacturing specification limits. Then, the method runs timing tests on the integrated circuit design and successively evaluates the timing test results in an iterative process that considers the timing performance sensitivity to the selected manufacturing parameters of interest. The design is made more robust to each parameter out of manufacturing range.

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