Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2011-02-22
2011-02-22
Levin, Naum B (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07895544
ABSTRACT:
A method for identifying latches in physical designs with unbalanced slack, comprising: creating a netlist describing a logical design, the logical design having a plurality of latches therein; performing a placement of the logical design to obtain a physical design; measuring a slack difference of each of the plurality of latches; selecting a color for each of the plurality of latches based on the slack difference correspondingly measured for each of the plurality of latches; and generating a graphical image identifying each one of the plurality of latches with slack difference in color, the color selected for each one of the plurality of latches with slack difference being indicative of the severity of the slack difference.
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Cantor & Colburn LLP
International Business Machines - Corporation
Levin Naum B
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