Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2006-07-18
2006-07-18
Nelms, David (Department: 2818)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
C257SE21388, C257SE21295, C257S316000, C438S295000, C438S400000
Reexamination Certificate
active
07078349
ABSTRACT:
A self-aligned conductive region to active region structure is disclosed in which parallel active regions of a semiconductor region of a substrate, which extends to a surface, are separated by STI regions. The STI regions have an insulator liner layer grown over their sides and are filled with an insulator filler layer. Equally spaced gate insulator regions, formed prior to the STI regions, are disposed over the active regions and overlap a portion of the insulator liner layer. Conductive regions, formed prior to the STI regions, are disposed over the gate insulator regions.
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Nelms David
Nguye Dao H.
Taiwan Semiconductor Manufacturing Co. Ltd.
Thomas, Kayden, Worstemeyer & Risley
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