Method to assay sacrificial light absorbing materials and...

Details Method to assay sacrificial light absorbing materials and... Method to assay sacrificial light absorbing materials and...

2006-05-25

2008-05-20

Toledo, Fernando L. (Department: 2823)

Semiconductor device manufacturing: process

Coating with electrically or thermally conductive material

To form ohmic contact to semiconductive material

C257SE21579

Reexamination Certificate

active

07375030

ABSTRACT:
Numerous embodiments of a method to assay sacrificial material are disclosed. In one embodiment, a sacrificial material may be analyzed by high performance liquid chromatography. Chemical markers that correlate with material contaminants in the sacrificial material may be identified.

REFERENCES:
patent: 6329118 (2001-12-01), Hussein et al.
patent: 6365529 (2002-04-01), Hussein et al.
patent: 6448185 (2002-09-01), Andideh et al.
patent: 6506692 (2003-01-01), Andideh et al.

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