Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-10-06
2008-10-21
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07441209
ABSTRACT:
A digital system includes one or more design entities containing a functional portion of the digital system. Within a configuration database, one or more configuration entities are instantiated. The configuration entities including an Error checking Dial (EDial) having a plurality of input latches within the digital design and a plurality of output latches within the digital design. The EDial has an associated function defining a relationship between values of the input latches and values of the output latches. An instance of the EDial in the configuration database is accessed to access the values of the output latches in the digital design.
REFERENCES:
patent: 6581191 (2003-06-01), Schubert et al.
patent: 6618839 (2003-09-01), Beardslee et al.
patent: 2004/0117744 (2004-06-01), Nation et al.
patent: 2004/0216076 (2004-10-01), Hunt et al.
Roesner Wolfgang
Shadowen Robert J.
Williams Derek E.
Dillon & Yudell LLP
Dinh Paul
International Business Machines - Corporation
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