Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-06-05
2007-06-05
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
11040139
ABSTRACT:
A circuit design technique is provided for automatically estimating lengths of interconnect segments to be employed in interconnecting at least some circuit components of a plurality of placed circuit components of a circuit layout. The automatically estimating includes automatically generating pin locations for a plurality of pins in at least one level of the hierarchy to be employed with the at least some circuit components of the circuit layout, wherein the interconnect segments interconnect the plurality of pins. A route estimator is employed to estimate lengths of the interconnect segments based on the pin locations of the plurality of pins. The estimated interconnect segment lengths are then employed in automatically estimating resistance capacitance interconnect parasitics for the interconnect segments to be employed in the circuit layout.
REFERENCES:
patent: 6080201 (2000-06-01), Hojat et al.
patent: 6523156 (2003-02-01), Cirit
patent: 6804810 (2004-10-01), Petersen et al.
patent: 7082587 (2006-07-01), Chen et al.
patent: 2002/0029371 (2002-03-01), Hwang et al.
Chan Yiu-Hing
Chu Jonathan M.
Augspurger, Esq. Lynn L.
Chiang Jack
Heslin Rothenburg Farley & Mesiti P.C.
International Business Machines - Corporation
Radigan, Esq. Kevin P.
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