Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-12-27
2005-12-27
Smith, Matthew (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
06981239
ABSTRACT:
A system, method and apparatus for constructing capped resistive vias are disclosed. In a preferred embodiment, a bare, electronic component substrate or printed circuit board via is preferably surrounded at each opening by a conductive pad. Defined by openings at a first and second surface of the substrate and a conductive material free wall defining the via is a void filled with one or more resistive inks and/or fills. A conductive cap is preferably coupled to the conductive pads such that an opening therein and the resistive fill exposed at the surface of the substrate is substantially covered. The presence of the conductive cap enables one or more electronic component conductors to be coupled directly to the capped resistive via.
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Masuyama Jinsaku
McMillan Thad
Baker & Botts L.L.P.
Dell Products L.P.
Smith Matthew
Tat Binh
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