Semiconductor device manufacturing: process – With measuring or testing – Electrical characteristic sensed
Reexamination Certificate
2007-10-02
2007-10-02
Lebentritt, Michael (Department: 2812)
Semiconductor device manufacturing: process
With measuring or testing
Electrical characteristic sensed
C257SE21521, C257SE21531
Reexamination Certificate
active
10866152
ABSTRACT:
Methods and systems for authenticating the operation of electronic devices, such as RFID tags are provided. In accordance with the method, a web of substrates having a plurality of devices attached thereto are received. The operation of a first set of the plurality of devices is authenticated. If it is determined that one or more devices is not operating properly, the location of each device is determined. The web of substrates is then moved incrementally to expose a second set of the plurality of devices. Each device that does not operate properly is indicated by applying ink to the substrate containing the device or by removing the device.
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Arneson Michael R.
Bandy William R.
Lebentritt Michael
Sterne Kessler Goldstein & Fox P.L.L.C.
Stevenson Andre′
Symbol Technologies Inc.
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