Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Patent
1997-05-02
2000-04-18
Nelms, David
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
438784, 438791, H01L 2131
Patent
active
060515104
ABSTRACT:
A method of employing an ambient diffusion barrier to isolate a first dielectric on a silicon substrate against further growth during formation of a second dielectric on the silicon substrate. Subsequent to formation of the diffusion barrier, an exposed surface area of the silicon substrate is subjected to a dielectric forming ambient. The dielectric forming ambient reacts with the exposed silicon surface to form the second dielectric. However, since the first dielectric is isolated, the dielectric forming ambient cannot diffuse therethrough and react with the silicon underlying the first dielectric thereby precluding any further growth in the first dielectric. Using this method, the first and second dielectrics can be formed with differing cross-sectional thicknesses or differing materials.
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Buller James Francis
Fulford Jr. H. Jim
Advanced Micro Devices , Inc.
Berry Renee R.
Nelms David
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