Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Reexamination Certificate
2006-04-18
2006-04-18
Gilliam, Barbara L. (Department: 1752)
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
C435S091500, C427S240000, C427S346000, C427S270000, C118S320000
Reexamination Certificate
active
07030039
ABSTRACT:
A method of and an apparatus for coating a substrate with a polymer solution to produce a film of uniform thickness, includes mounting the substrate inside an enclosed housing and passing a control gas, which may be a solvent vapor-bearing gas into the housing through an inlet. The polymer solution is deposited onto the surface of the substrate in the housing and the substrate is then spun. The control gas and any solvent vapor and particulate contaminants suspended in the control gas are exhausted from the housing through an outlet and the solvent vapor concentration is controlled by controlling the temperature of the housing and the solvent from which the solvent vapor-bearing gas is produced. Instead the concentration can be controlled by mixing gases having different solvent concentrations. The humidity of the gas may also be controlled.
REFERENCES:
patent: 3198657 (1965-08-01), Kimball et al.
patent: 4068019 (1978-01-01), Boeckl
patent: 4113492 (1978-09-01), Sato et al.
patent: 4132357 (1979-01-01), Blackinton
patent: 4267212 (1981-05-01), Sakawaki
patent: 4347302 (1982-08-01), Gotman
patent: 4393807 (1983-07-01), Fujimura et al.
patent: 4438159 (1984-03-01), Weber
patent: 4451507 (1984-05-01), Beltz et al.
patent: 4510176 (1985-04-01), Cuthbert et al.
patent: 4514440 (1985-04-01), Justice et al.
patent: 4518678 (1985-05-01), Allen
patent: 4551355 (1985-11-01), Ericson et al.
patent: 4600597 (1986-07-01), White et al.
patent: 4732785 (1988-03-01), Brewer
patent: 4741926 (1988-05-01), White et al.
patent: 4800836 (1989-01-01), Yamamoto et al.
patent: 4822639 (1989-04-01), Fujii et al.
patent: 4886012 (1989-12-01), Ikeno et al.
patent: 4932353 (1990-06-01), Kawata et al.
patent: 4946710 (1990-08-01), Miller et al.
patent: 4963390 (1990-10-01), Lipeles et al.
patent: 5013586 (1991-05-01), Cavazza
patent: 5066616 (1991-11-01), Gordon
patent: 5094884 (1992-03-01), Hillman et al.
patent: 5095848 (1992-03-01), Ikeno
patent: 5127362 (1992-07-01), Iwatsu et al.
patent: 5134962 (1992-08-01), Amada et al.
patent: 5135608 (1992-08-01), Okutani
patent: 5143552 (1992-09-01), Moriyama
patent: 5158860 (1992-10-01), Gulla et al.
patent: 5180431 (1993-01-01), Sugimoto et al.
patent: 5198034 (1993-03-01), deBoer et al.
patent: 5234499 (1993-08-01), Sasaki et al.
patent: 5238713 (1993-08-01), Sago et al.
patent: 5264246 (1993-11-01), Ikeno
patent: 5271955 (1993-12-01), Maniar
patent: 5318800 (1994-06-01), Gong et al.
patent: 5358740 (1994-10-01), Bornside et al.
patent: 5366757 (1994-11-01), Lin
patent: 5378511 (1995-01-01), Cardinali et al.
patent: 5391393 (1995-02-01), Maniar
patent: 5395803 (1995-03-01), Adams
patent: 5449405 (1995-09-01), Cardinali et al.
patent: 5472502 (1995-12-01), Batchelder
patent: 5532192 (1996-07-01), Adams
patent: 5670210 (1997-09-01), Mandal et al.
patent: 5762709 (1998-06-01), Sugimoto et al.
patent: 5954878 (1999-09-01), Mandal et al.
patent: 5985363 (1999-11-01), Shiau et al.
patent: 6027760 (2000-02-01), Gurer et al.
patent: 6191053 (2001-02-01), Chun et al.
patent: 6238735 (2001-05-01), Mandal et al.
patent: 6248168 (2001-06-01), Takeshita et al.
patent: 6317642 (2001-11-01), You et al.
patent: 6387825 (2002-05-01), You et al.
patent: 6407009 (2002-06-01), You et al.
patent: 6468951 (2002-10-01), Grieger et al.
patent: 2001/0017103 (2001-08-01), Takeshita et al.
patent: 2001/0033895 (2001-10-01), Minami et al.
patent: 2002/0127334 (2002-09-01), Gurer et al.
patent: 2002/0150691 (2002-10-01), Kitano et al.
patent: 279033 (1990-05-01), None
patent: 46-10790 (1971-03-01), None
patent: 46-42658 (1971-12-01), None
patent: 57-45369 (1982-03-01), None
patent: 57-130432 (1982-08-01), None
patent: 61-02925 (1984-06-01), None
patent: 60-10248 (1985-01-01), None
patent: 60-226125 (1985-11-01), None
patent: 61-29125 (1986-02-01), None
patent: 0176119 (1986-08-01), None
patent: 0206224 (1986-09-01), None
patent: 0092316 (1987-04-01), None
patent: 62-225269 (1987-10-01), None
patent: 63-032921 (1988-02-01), None
patent: 0085626 (1988-04-01), None
patent: 63-119531 (1988-05-01), None
patent: 63-301520 (1988-12-01), None
patent: 64-27667 (1989-01-01), None
patent: 1-238017 (1989-09-01), None
patent: 0098126 (1990-04-01), None
patent: 2-98126 (1990-04-01), None
patent: 2-119226 (1990-05-01), None
patent: 3-22428 (1991-01-01), None
patent: 3-41715 (1991-02-01), None
patent: 3175617 (1991-07-01), None
patent: 4-9823 (1992-01-01), None
patent: 4-62915 (1992-02-01), None
patent: 4-104158 (1992-04-01), None
patent: 4-332116 (1992-11-01), None
patent: 04-361524 (1992-12-01), None
patent: 05-021306 (1993-01-01), None
patent: 05-141058 (1993-06-01), None
patent: 5-166712 (1993-07-01), None
patent: 6-170316 (1994-06-01), None
patent: 8-168715 (1996-07-01), None
patent: WO 98/57757 (1998-12-01), None
J. Van Schoot et al., “The Mask Error: Causes and Implications for Process Latitude” (Part of the SPIE Conference on Optical Microlithography XII), Mar. 1999, p. 250-260, SPIE vol. 3679, Santa Clara, CA.
F.M. Schellenberg et al., “Impact of Mask Error on Full Chip Error Budgets”, (Part of the SPIE Conference on Optical Microlithography XII), Mar. 1999, p. 261-275, SPIE vol. 3679, Santa Clara, CA.
M.S. Krishna et al., “Characterization of Advanced DUV PhotoResists”, (Part of the SPIE Conference on Advances in Resist Technology and Processing XVI), Mar. 1999, p. 607-614, SPIE vol. 3678, Santa Clara, CA.
J. Lewellen et al., “Effect of PEB Temperature Profile on CD and DUV Resists”, (Part of the SPIE Conference on Process, Equipment, and Materials Control in Integrated Circuit Manufacturing V), Mar. 1999, p. 45-54, SPIE vol. 3882, Santa Clara, CA.
D.E. Bornside et al., “Spin Coating: One-dimensional mode”, J. Appl. Phys. 66(11), Dec. 1989, p. 5185-5193, American Institute of Physics.
R. Kobayashi et al., “Contributed Papers—Spiral Vortices in boundary Layer Transition Regime on a Rotating Disk” Acta Mechanica, 1980, p. 35, 71-82 (14 pages total), vol. 35/1-2, Springer-Verlag, Wien, New York.
R.M. Crowell, “Determining Photoresist Coat Sensitivities of 300 mm Wafers”, Feb. 1998, p. 414-419 (7 pages total) SPIE vol. 3331, Santa Clara, CA.
B. Lorefice et al., “How to Minimize Resist Usage During Spin Coating”, Semiconductor International, Jun. 1998, p. 179-190 (14 pages total), vol. 21, No. 6.
L. Peters, “Solving the Integration Challenges of Low-K Dielectrics”, Nov. 1999, p. 56-64 (11 pages total), Semiconductor International, vol. 22, No. 13.
D.E. Bornside, “Spin Coating”, Aug. 1988, (201 pages total), Ph.D. Thesis, University of Minnesota.
J. Derksen, “A New Coating Method for Semiconductor Lithography: Fluid Layer Overlap In Extrusion-Spin Coating”, Jun. 1997, (67 pages total), Massachusetts Institute of Technology.
S. Han, Modeling and Analysis of Extrusion-Spin Coating: An Efficient and Deterministic Photoresist Coating Method of Microlithography, Feb. 2001, 179 pages, Massachusetts Institute of Technology.
Bagen, Susan, et al., Extrusion Coating of Polymer Films for Low-Cost Flat Panel Display Manufacturing, 1996 Display Manufacturing Technology Conference, Digest of Technical Papers, pp. 35-36 (1996).
Bixler, Nathan Ephraim, Stability Of A Coating Flow, PhD Dissertation submitted to the University of Minnesota, Jun. 1982.
Bornside, David, E., et al., The effects of gas phase convection on mass transfer in spin coating, Journal of Applied Physics, vol. 73, No. 2, Jan. 15, 1993, pp. 585-600, © 1993 American Institute of Physics.
Bornside, D.E., et al., On the Modeling of Spin Coating, Journal of Imaging Technology, vol. 13, No. 4, Aug. 1987, pp. 122-130, © 1987, SPSE—The Society of Imaging Science and Technology.
Cohen, et al., Modern Coating And Drying Technology, Chapter 4, Premetered Coating, pp. 117-167, VCH Publishers, Inc., (1992).
Emslie, Alfred G., et al., Flow of a Viscous Liquid on a Rotating Disk, Journal Of Applied Physics, vol. 29, No. 5, May 1958, pp. 858-862.
Fraysse, Nathalie, et al., An experimen
Bettes Ted C.
Chun Jung-Hoon
Grambow James C.
Gurer Emir
Han Sangjun
ASML Holding N.V.
Blakely & Sokoloff, Taylor & Zafman
Gilliam Barbara L.
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