Method of testing the data exchange functionality of a memory

Details Method of testing the data exchange functionality of a memory Method of testing the data exchange functionality of a memory

2006-12-12

2006-12-12

Kerveros, James C. (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Memory testing

C714S733000, C714S738000

Reexamination Certificate

active

07149939

ABSTRACT:
Method of testing the functionality of a memory which operates at a high operating clock frequency, the method specifically having the following steps, generation of test data, copying of the generated test data at the high operating clock frequency, comparison of the copied test data with the generated test data, generation of a functionality-indicating signal for indicating the functionality of the memory if the copied test data are identical to the generated test data.

REFERENCES:
patent: 5818772 (1998-10-01), Kuge
patent: 6092225 (2000-07-01), Gruodis et al.
patent: 6557128 (2003-04-01), Turnquist
patent: 6681359 (2004-01-01), Au et al.
patent: 197 49 240 (1999-05-01), None

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