Method of testing semiconductor devices and handler used for...

Details Method of testing semiconductor devices and handler used for... Method of testing semiconductor devices and handler used for...

2006-09-27

2009-12-15

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S765010

Reexamination Certificate

active

07633288

ABSTRACT:
Example embodiments may provide a method of testing semiconductor devices by identifying units of lots and a test tray such that a plurality of lots having semiconductor devices may be continuously tested by a handler. Example embodiments may also provide a handler used to test the semiconductor devices.

REFERENCES:
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patent: 7333016 (2008-02-01), Ancel
patent: 1020040032318 (2002-10-01), None
patent: 10-2005-0092152 (2006-09-01), None
Office Action for Corresponding Korean Application No. 10-2005-0092152 dated Sep. 18, 2006 and English translation thereof.

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