Method of testing semiconductor apparatus

Details Method of testing semiconductor apparatus Method of testing semiconductor apparatus

2007-10-30

2007-10-30

Kerveros, James C. (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Skew detection correction

Reexamination Certificate

active

10936533

ABSTRACT:
A method of testing a semiconductor apparatus includes a step of dividing a region in the semiconductor apparatus into a plurality of divided regions, a step of extracting all of paths starting at registers and terminating at other registers present in the respective divided regions as candidate paths, a step of calculating delay times in signal transmissions of the candidate paths and selecting the candidate path having a maximum delay time in each divided region as a critical path, and a step of conducting a delay test for the critical path in each divided region to thereby accurately screen the semiconductor apparatus.

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