Method of testing flash memory

Details Method of testing flash memory Method of testing flash memory

1995-06-05

1996-12-03

Nelms, David C.

Static information storage and retrieval

Read/write circuit

Testing

365218, 36518533, 371 213, 437 8, G11C 700, G11C 1134, G11C 2900, G01R 3126

Patent

active

055815103

ABSTRACT:
According to a time required for programing operation, respective chips of flash memories are divided into a first group and a second group of chips requiring a time longer than the first group for the programing operation, and a postburn-in test, a high temperature test, and a low temperature test are carried out to a plurality of chips belonging to the first group simultaneously, and to a plurality of chips belonging to the second group simultaneously.

REFERENCES:
patent: 4578751 (1986-03-01), Erwin
patent: 5399505 (1995-03-01), Dasse et al.

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