Method of testing data-holding capability of a semiconductor mem

Details Method of testing data-holding capability of a semiconductor mem Method of testing data-holding capability of a semiconductor mem

1992-06-24

1994-02-15

LaRoche, Eugene R.

Static information storage and retrieval

Read/write circuit

Testing

156643, 156345, H01L 2166, H01L 2978

Patent

active

052873137

ABSTRACT:
Test data is written into respective semiconductor memory devices, e.g., EEPROMs formed on a wafer. Then, the semiconductor memory devices, still located on the wafer, are baked in a high-temperature atmosphere for a predetermined time. Examples of the baking temperature and time are 200.degree. C. and 8 hours. The test data is read from the respective semiconductor devices to check whether the test data is held by the respective memory devices in a correct manner.

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