Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2002-02-13
2010-02-09
Tabone, Jr., John J (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S719000, C714S720000, C714S726000, C714S732000, C714S733000, C714S736000
Reexamination Certificate
active
07661040
ABSTRACT:
The sequential access memory array is able to store p words each of n bits. Such p test words each made up of n test bits are written in the memory array, the p test words are extracted sequentially and, for each current word extracted, the n test bits that compose it are compared sequentially with n respective expected data bits before extracting the next test word.
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Alofs Thomas
Armagnat Paul
Beaujoin Marc
Allen Dyer Doppelt Milbrath & Gilchrist, P.A.
Jorgenson Lisa K.
STMicroelectronics S.A.
Tabone, Jr. John J
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