Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Patent
1994-09-27
1999-11-02
Bowers, Charles
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
427561, 427562, 427579, H01L 21316
Patent
active
059769920
ABSTRACT:
A method of supplying an excited oxygen, which comprises the steps of exciting a oxygen gas or a gas containing an oxygen atoms with plasma in a plasma discharge zone thereby forming an excited oxygen, and transferring a gas containing the excited oxygen into a reaction zone disposed next to the plasma discharge zone while keeping a pressure within the plasma discharge zone lower than that of the reaction zone. In a reaction chamber, a reaction by the excited oxygen is effected. As a result, the formation of a thin film on a substrate disposed in a reaction chamber, the etching of the substrate and the cleaning of the interior of the reaction chamber can be carried out.
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Jpn. J. Appl. Phys., vol. 33, 1994, pp. 3520-3527, Part 1, No. 6A, Jun. 1994, Sunil Wickramanayaka, et al., "Remote Plasma SiO2, Deposition by Tetraethoxysilane with Chemically and Energetically Different Atomic Species".
Matsui Isao
Nakamura Yoshiaki
Ui Akio
Bowers Charles
Kabushiki Kaisha Toshiba
Whipple Matthew
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