Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Insulative material deposited upon semiconductive substrate
Patent
1998-01-12
2000-02-01
Bowers, Charles
Semiconductor device manufacturing: process
Coating of substrate containing semiconductor region or of...
Insulative material deposited upon semiconductive substrate
438723, H01L 2100
Patent
active
060202734
ABSTRACT:
A method of forming dielectric films is described wherein the low dielectric constant of a layer of dielectric material having a low dielectric constant, such as low dielectric constant spin-on-glass, is stabilized to prevent subsequent processing steps from increasing the dielectric constant. The layer of dielectric material having a low dielectric constant is treated in an inert atmosphere, such as nitrogen or argon, at an elevated temperature. This inert atmosphere treatment of the dielectric prevents the dielectric constant from increasing during subsequent processing steps.
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patent: 5549786 (1996-08-01), Jones et al.
patent: 5567658 (1996-10-01), Wang et al.
patent: 5643407 (1997-07-01), Chang
Cheng Yao-Yi
Jang Syun-Min
Yu Chen-Hua
Ackerman Stephen B.
Bowers Charles
Kilday Lisa
Prescott Larry J.
Saile George O.
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