X-ray or gamma ray systems or devices – Accessory – Testing or calibration
Reexamination Certificate
2006-04-25
2006-04-25
Bruce, David V. (Department: 2882)
X-ray or gamma ray systems or devices
Accessory
Testing or calibration
C378S205000, C378S137000
Reexamination Certificate
active
07033076
ABSTRACT:
A method of calibrating an electron beam tomography (EBT) system includes determining a change in x-ray intensity for detecting elements in each detector array through multiple imaging sweeps during an initial activation of the EBT system, deriving scale factors based on the determined changes in x-ray intensity for the imaging sweeps, and using the scale factors to modify a trajectory and deflection of the electron beam during the multiple imaging sweeps to maintain constant x-ray intensity on each detector array.
REFERENCES:
patent: 4352021 (1982-09-01), Boyd et al.
patent: 5442673 (1995-08-01), Rand et al.
Magnuson Paul
Sengupta Souma
Bruce David V.
Dellapenna Michael A.
GE Medical Systems Global Technology Company LLC
McAndrews Held & Malloy Ltd.
Thomas Courtney
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