Method of sizing via arrays and interconnects to reduce...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000

Reexamination Certificate

active

07107561

ABSTRACT:
A method and computer program are disclosed for reducing routing congestion in an integrated circuit design that include steps of: (a) receiving as input a design for an integrated circuit die having an inner metal layer and a top metal layer wherein the design includes electrical constraints of each of a plurality of I/O circuits in the integrated circuit die; (b) selecting a number of vias for a via array to form an electrical connection between the inner metal layer and the top metal layer of the integrated circuit die that connects a solder bump formed on the top metal layer to a corresponding one of the plurality of I/O circuits wherein the number of vias is selected to satisfy the electrical constraints of the corresponding one of the plurality of I/O circuits; and (c) generating as output the number of vias determined for the via array.

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