4. Electric power conversion systems
  5. Current conversion
  6. Including d.c.-a.c.-d.c. converter

Katsuhiko Inaba

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Method and apparatus for measuring thin film, and thin film...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Method of setting measuring range of reciprocal-space mapping

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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Switching regulator having improved switching control arrangemen

Electric power conversion systems – Current conversion – Including d.c.-a.c.-d.c. converter
Patent

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Profile ID: LFUS-PAI-P-732551

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