Method of selectively etching silicon

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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156647, 156653, 156657, 1566591, 156662, 20412965, 252 795, H01L 21306, B44C 122, C03C 1500, C03C 2506

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051299810

ABSTRACT:
The present invention relates to a method of forming thin bodies of a semiconductor material, such as single crystalline silicon, by selectively etching away a portion of the body until a body of the desired thicknes is obtained. The body includes a p-n junction made up of adjacent regions of p-type and n-type conductivity which are immersed in a chemical etchant with the surface of the p-type region being exposed to the etchant. A time varying voltage waveform having first and second voltage levels is applied through the etchant to the p-n junction. The first voltage level causes a zero forward bias across the p-n junction and the second voltage level causes a reverse bias across the p-n junction. The p-type region is removed by the chemical etchant down to the n-type region. This essentially removes the p-n junction in the area where the p-type region is etched away and resulting current through the n-type region causes a passivating layer to form on the surface of the n-type region which stops further etching.

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