Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-06-21
2005-06-21
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C703S013000, C706S013000
Reexamination Certificate
active
06910192
ABSTRACT:
Robust design using a search engine in to solve technological design problems. The method including selecting one of first and second candidates based on at least one objective function, sampling the first candidate and determining one or more sample objective function values for the first candidate. The method continues by sampling the second candidate and determining one or more sample objective function values for the second candidate, then statistically determining, based on the sampled objective function values, corresponding first and second statistical estimators of design quality; and comparing the first and second statistical estimators of design quality. The method continues to take more samples and make more estimates adaptively, until a given level of certainty about one individual being best (“winning individual”) is surpassed, at which point the said winning individual is selected.
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Bever Hoffman & Harms LLP
Garbowski Leigh M.
Harms Jeanette S.
Synopsys Inc.
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