Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-01-03
2006-01-03
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
06983430
ABSTRACT:
A system and method for resolving mismatched parameters in computer-aided design of integrated circuits during schematic migration. The system compares the parameters within the circuit primitives of the target and source schematic databases and detects if the parameters are different. If so, the system alters the parameter in the target circuit primitive to resolve the mismatch.
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Hegde Shailesh U.
Isom, III Melvin T.
Brinks Hofer Gilson & Lione
Garbowski Leigh M.
Infineon - Technologies AG
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