Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Grooved and refilled with deposited dielectric material
Reexamination Certificate
2008-01-14
2010-06-29
Richards, N Drew (Department: 2895)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Grooved and refilled with deposited dielectric material
C438S291000, C438S296000, C438S424000, C438S477000, C257SE21252, C257SE21293
Reexamination Certificate
active
07745305
ABSTRACT:
A method of removing a portion of an oxide layer includes forming first byproducts by reacting a reaction gas with the oxide layer, the reaction gas including fluorine and nitrogen, reacting the reaction gas with the first byproducts to form second byproducts, and removing the second byproducts.
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Kim Ju-Wan
Kim Taek-Jung
Lee Seung-Heon
Na Kyu-Tae
Lee Kyoung
Lee & Morse P.C.
Richards N Drew
Samsung Electronics Co,. Ltd.
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