Chemistry: analytical and immunological testing – Measurement includes temperature change of the material...
Reexamination Certificate
2007-03-22
2010-11-23
Bhat, N. (Department: 1797)
Chemistry: analytical and immunological testing
Measurement includes temperature change of the material...
C436S002000, C165S080300, C165S185000, C422S105000
Reexamination Certificate
active
07838300
ABSTRACT:
A method of reducing a temperature difference between a high-temperature and a low-temperature substrate includes interposing a heat transfer facilitating layer which has a higher thermal conductivity than air and can hold particles between the substrates, and maintaining close contact between the high-temperature substrate, the heat transfer facilitating layer, and the low-temperature substrate, wherein formation of an air layer can be at least substantially prevented between the high-temperature substrate and the heat transfer facilitating layer, and between the low-temperature substrate and the heat transfer facilitating layer.
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patent: 2004/0005720 (2004-01-01), Cremer et al.
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European Search Report dated Jan. 2, 2008; Appl. No. 07104705.4-1528 (All references cited in Search Report are cited above).
Kim Jin-tae
Kim Su-hyeon
Lee Young-sun
Namkoong Kak
Park Chin-sung
Bhat N.
Cantor & Colburn LLP
Samsung Electronics Co,. Ltd.
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