Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-03-20
2007-03-20
Dinh, Paul (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
10605683
ABSTRACT:
A method utilizing available timing slack in the various timing paths of a synchronous integrated circuit to reduce the overall instantaneous current draw across the circuit. In the method, each timing path is analyzed to determine its late mode margin or its late mode margin and early mode margin. A delay is added to each timing path having a late mode margin greater than zero. Each delay effectively shifts the peak current draw for the corresponding timing path within each clock cycle so that the peaks do not occur simultaneously across all timing paths. In other embodiments, the peak overall instantaneous current draw can be further reduced by reducing the delay in some of the delayed timing paths.
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Kartschoke Paul D.
Rohrer Norman J.
Dinh Paul
Downs Rachlin & Martin PLLC
Parihar Suchin
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