Image analysis – Histogram processing – For setting a threshold
Patent
1989-08-07
1991-10-01
Razavi, Michael
Image analysis
Histogram processing
For setting a threshold
382 50, 382 49, G06K 962
Patent
active
050540955
ABSTRACT:
A method of recognizing a pattern in a field having a multi-valent amplitude, and a device for performing the method, uses association with a reference mask which is composed of logic high units and logic low units. The reference mask is sub-divided into two sub-masks, units having the same logic value belonging to the same sub-mask. The first and the second sub-mask contain relevant logic high units and logic low units, respectively. After the positioning of the sub-masks in the field, a relatively lowest and a relatively highest value of the amplitude are determined within the window of the first and the second sub-mask, respectively. When the difference formed by the relatively lowest value minus the relatively highest value is not negative, the desired pattern can in principle be recognized in the field. The device for performing the method includes at least one rank-value filter for determining the relatively highest value and the relatively lowest value. There is also determined the sign of the difference between the relatively lowest value and the relatively highest value.
REFERENCES:
patent: 4491962 (1985-01-01), Sakou et al.
patent: 4491964 (1985-01-01), Sanner
Bernsen Johannes A. C.
van den Boomgaard Reinier
Razavi Michael
Slobod Jack D.
U.S. Philips Corp.
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