Etching a substrate: processes – Masking of a substrate using material resistant to an etchant – Mask resist contains organic compound
Patent
1996-11-19
1999-03-09
Green, Anthony
Etching a substrate: processes
Masking of a substrate using material resistant to an etchant
Mask resist contains organic compound
216 2, 216 67, 216 99, 438710, 438719, 438725, 438735, 438745, 438753, 438781, 438942, 438970, 438976, H01L 213065, H01L 21308, C23F 102
Patent
active
058795723
ABSTRACT:
A process for bulk micromachining a silicon wafer to form a silicon micromachined structure. The process involves the application of a protective film on one or more surfaces of the silicon wafer to protect metallization and circuitry on the wafer during the bulk micromachining process, during which a wet chemical etchant is employed to remove bulk silicon from a surface of the silicon wafer. The protective film is divinylsiloxane bisbenzocyclobutene (BCB), which has been found to be highly resistant to a wide variety of wet chemical etchants, and retains such resistant at elevated temperatures commonly preferred for bulk silicon etching. The degree to which this material is cured prior to etching is advantageously tailored to promote its resistance to the etchant and promote its adhesion to the silicon wafer.
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Chilcott Dan Wesley
Folsom Joseph Keith
Haller Johnna Lee
Delco Electronics Corporation
Funke Jimmy L.
Green Anthony
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