Method of producing semiconductor device involving the use of si

Adhesive bonding and miscellaneous chemical manufacture – Delaminating processes adapted for specified product – Delaminating in preparation for post processing recycling step

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148175, 156657, 427 85, 427 94, 427399, H01L 21318, H01L 21308, H01L 2132

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active

041558022

ABSTRACT:
A method of producing a semiconductor device comprises removing all of the masking films used for forming desired semiconductor regions in the substrate, newly forming an insulation film and selectively forming a second insulation film at predetermined portions by the use of a silicon nitride film as the mask.

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patent: 3958040 (1976-05-01), Webb
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Shasteen "Recessed Oxide Isolation Technique" IBM Tech. Disc. Bul. vol. 19, No. 10 3/77 p. 3672.
Appels et al. "Local Oxidation of Silicon and its Application in Semiconductor Device Technology" Phillips Res. Rep., vol. 25, No. 2, Apr. 1970 pp. 118-132.

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