Method of producing relief structures for integrated semiconduct

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

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427 431, 430299, B05D 306

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044057075

ABSTRACT:
Relief structures comprised of double lacquer layers on substrates already having relief structures for integrated semiconductor circuits are produced by applying a lower lacquer layer onto such substrate and which is composed of a material which does not cross-link or decompose due to radiation energy and which has only relatively slight sensitivity at the radiation energy dosage range utilized for structuring; applying an upper lacquer layer onto the lower lacquer layer and which upper layer is thinner relative to the thickness of the lower layer by a factor of at least 2 and is composed of a highly sensitive negative lacquer material; generating desired relief structures in the upper lacquer layer and removing those portions of the lower lacquer which are not covered by the upper negative lacquer layer.

REFERENCES:
patent: 4004044 (1977-01-01), Franco et al.
patent: 4024293 (1977-05-01), Hatzakis
patent: 4202914 (1980-05-01), Havas et al.
patent: 4204009 (1980-05-01), Feng et al.
patent: 4268601 (1981-05-01), Namiki et al.
patent: 4287297 (1981-09-01), Ishihara et al.

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