Method of producing integrated semiconductor components on a...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C119S081000, C257SE21108

Reexamination Certificate

active

10497203

ABSTRACT:
There is provided a method of producing multiple semiconductor components on a substrate, said method comprising the steps of: forming a predetermined relief pattern on a surface of said substrate; and epitaxially depositing a layer formed of a mixture of two or more Group III elements and two or more Group V elements on said surface; wherein said relief pattern results in said layer deposited in a single step forming with a different ratio between said Group V elements within areas having different relief pattern characteristics so as to provide different band gaps within said different areas.

REFERENCES:
patent: 4961198 (1990-10-01), Ishino et al.
patent: 5185289 (1993-02-01), Meier et al.
patent: 5436194 (1995-07-01), Kondo et al.
patent: 5901265 (1999-05-01), Tohyama et al.
patent: 6399404 (2002-06-01), Sakata
patent: 6403451 (2002-06-01), Linthicum et al.
patent: 6579780 (2003-06-01), Takahashi
patent: 6865207 (2005-03-01), Kawanishi et al.
patent: 6868214 (2005-03-01), Sakata et al.
patent: 2001/0002048 (2001-05-01), Koike et al.
patent: 2001/0012678 (2001-08-01), Tanaka et al.
patent: 2002/0137249 (2002-09-01), Ishida et al.
patent: 2003/0123829 (2003-07-01), Taylor
patent: 0 653 822 (1995-05-01), None
patent: 0 952 470 (1999-10-01), None
Borchert et al.,1.29 μm GalnNAs multiple quantum-well ridge-waveguide laser diodes with improved performance, Electronics Letters, Electronics Letters, IEE Stevenage, GB, vol. 35, No. 25, Dec. 9, 1999, pp. 2204-2206, XP006013084.
Arai et al.,Monolithic Formation of Metal Organic Chemical Vapor Deposition Grown Multi-wavelength Verical Cavities with Highly Strained GalnAs/GaAs Quantum Wells on GaAs(#11)B, Japanese Journal of Applied Physics, Publication Office Japanese Journal of Applied Physics., Tokyo, JP, vol. 40, No. 6A, part 1, Jun. 2001, pp. 4056-4057, XP001078652.
Ortiz et al.,Monolithic Wavelength-Graded VCSEL and Resonance-Enhanced Photodetector Arrays for Parallel Optical Interconnects, Lasers and Electro-Optics Society Annual Meeting, 1997, LEOS '97 10thAnnual Meeting, Conference Proceedings, IEEE, San Francisco, CA, USA, Nov. 10-13, 1997, New York, NY, USA, IEEE, US, Nov. 10, 1997, pp. 79-80, XP010252705.
Arai et al; “Monolithic Formation of Metal Organic Chemical Vapor Deposition Grown Multi-Wavelength Vertical Cavities With Highly Strained Gains/GAAS Quatum Wells on GAAS (311)B”; Japanese Journal of Applied Physics, Publication Office Japanese Journal of Applied Physics., Tokyo, JP, vol. 40, No. 6A, part 1, Jun. 2001, pp. 4056-4057, XP001078652.
Ortiz et al; “Monolithic Wavelength-Graded VCSEL and Resonance-Enhanced Photodetector Arrays for Parallel Optical Interconnects”; Lasers and Electro-Optics Society Annual Meeting, 1997, LEOS '97 10thAnnual Meeting, Conference Proceedings, IEEE, San Francisco, CA, USA, Nov. 10-13, 1997, New York, NY, USA, IEEE, US, Nov. 10, 1997, pp. 79-80, XP010252705.
Borchert et al; “1.29 µm GaInNAs Multiple Quantum-Well Ridge-Waveguide Laser Diodes With Improved Performance” Electronics Letters, IEE Stevenage, GB, vol. 35, No. 25, Dec. 9, 1999, pp. 2204-2206, XP006013084.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of producing integrated semiconductor components on a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of producing integrated semiconductor components on a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of producing integrated semiconductor components on a... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3844219

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.