Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Physical stress responsive
Patent
1997-10-08
2000-06-20
Chaudhuri, Olik
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
Physical stress responsive
438 51, 438 52, 438691, 438125, H01L 2100
Patent
active
060777214
ABSTRACT:
A semiconductor sensor mount is formed as follows: through holes are formed that penetrate a glass plate; and then the glass plate having the through holes is dipped into hydrofluoric acid etchant to smooth the inner peripheral surfaces of the respective through holes. By etching the inner peripheral surfaces of the respective through holes after the through hole formation, minute roughness and cracks formed on the inner peripheral surfaces are removed, and thereby the areas for adsorbing gas are substantially reduced. That is, vacuums within the through holes can be maintained at a high degree during the anodic bonding, whereby undesirable electric discharge phenomena are prevented even if a relatively high voltage is applied during the anodic bonding. Accordingly, the yield of products can be improved while improving productivity.
REFERENCES:
patent: 3397278 (1968-08-01), Pomerantz
patent: 3938175 (1976-02-01), Jaffe et al.
patent: 3951707 (1976-04-01), Kurtz et al.
patent: 4597027 (1986-06-01), Letho
patent: 4632871 (1986-12-01), Karnezos et al.
patent: 4730496 (1988-03-01), Knecht et al.
patent: 4743567 (1988-05-01), Pandya et al.
patent: 4831492 (1989-05-01), Kuisma
patent: 4833920 (1989-05-01), Knecht et al.
patent: 5289721 (1994-03-01), Tanizawa et al.
patent: 5362575 (1994-11-01), Trimble
patent: 5395481 (1995-03-01), McCarthy
patent: 5528214 (1996-06-01), Koga et al.
patent: 5549785 (1996-08-01), Sakai et al.
patent: 5736061 (1998-04-01), Fukada et al.
"A New Silicon-On-Glass Process Integrated Sensors", 1988 Technical Digest, pp. 140-143.
Fukada Tsuyoshi
Kawashima Hiroaki
Satoh Koushu
Suzuki Yasutoshi
Chambliss Alonzo
Chaudhuri Olik
Iwaki Glass Co., Ltd.
Nippondenso Co. Ltd.
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