Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Ion implantation of dopant into semiconductor region
Reexamination Certificate
2006-11-14
2010-11-02
Picardat, Kevin M (Department: 2822)
Semiconductor device manufacturing: process
Introduction of conductivity modifying dopant into...
Ion implantation of dopant into semiconductor region
C438S162000, C438S407000, C438S527000, C438S529000, C438S530000, C438S532000
Reexamination Certificate
active
07825016
ABSTRACT:
In a method for fabricating a semiconductor element in a substrate, micro-cavities are formed in the substrate. Furthermore, doping atoms are implanted into the substrate, whereby crystal defects are produced in the substrate. The substrate is heated, so that at least some of the crystal defects are eliminated using the micro-cavities, and the semiconductor element is formed using the doping atoms.
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Au Bac H
Dickstein & Shapiro LLP
Infineon - Technologies AG
Picardat Kevin M
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