Etching a substrate: processes – Masking of a substrate using material resistant to an etchant
Patent
1995-07-31
1997-09-02
Gorgos, Kathryn L.
Etching a substrate: processes
Masking of a substrate using material resistant to an etchant
20419215, 20419217, 216 55, 216 95, 216101, G01J 506
Patent
active
056628188
ABSTRACT:
A pyroelectric infrared radiation detector for detecting the intensity of infrared radiation with a pyroelectric element is provided. The pyroelectric infrared radiation detector comprises a substrate made of a single crystal material such as (100) magnesium oxide and an infrared radiation detecting structure which comprises a first electrode disposed on the substrate, a pyroelectric thin film disposed on the first electrode, and a second electrode disposed on the pyroelectric thin film for absorption of infrared radiation. The substrate has a recess provided in the upper surface thereof where the infrared radiation detecting structure is seated. A method of producing the pyroelectric infrared radiation detector comprises a first step of forming a first electrode on one surface of a substrate, a second step of forming a pyroelectric thin film on the first electrode, a third step of forming a second electrode on the pyroelectric thin film, a fourth step of providing etching apertures in the first electrode which are open to the substrate, and a fifth step of providing by wet etching process at least one recess in the surface of the substrate where the first electrode is seated.
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Kotani Tokumi
Kuramasu Keizaburo
Nakanishi Tutomu
Nomura Koji
Gorgos Kathryn L.
Leader William T.
Matsushita Electric - Industrial Co., Ltd.
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