Method of processing an optical substrate

Optics: measuring and testing – By light interference – For dimensional measurement

Reexamination Certificate

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Reexamination Certificate

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11230455

ABSTRACT:
A method of processing an optical substrate having a convex surface comprises an interferometric measurement using a beam of diverging measuring light traversing the substrate and reflected from a concave mirror.

REFERENCES:
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patent: 2002/0063867 (2002-05-01), Otto
J.E. Greivenkamp, et al., “Phase Shifting Interferometry”, Optical Shop Testing, Second Edition, Edited by Daniel Malacara, Chapter 14.1 to 14.3, 1992, pp. 501-507.

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