Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate
2007-01-23
2007-01-23
Lee, Hwa (Andrew) (Department: 2877)
Optics: measuring and testing
By light interference
For dimensional measurement
Reexamination Certificate
active
11230455
ABSTRACT:
A method of processing an optical substrate having a convex surface comprises an interferometric measurement using a beam of diverging measuring light traversing the substrate and reflected from a concave mirror.
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Doerband Bernd
Tannert Rudolf
Ulrich Wilhelm
Carl Zeiss SMT AG
Jones Day
Lee Hwa (Andrew)
Lyons Michael A.
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