Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation
Reexamination Certificate
2007-04-16
2008-12-30
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Performance or efficiency evaluation
C702S082000, C324S537000, C324S760020
Reexamination Certificate
active
07472038
ABSTRACT:
A method of predicting the lifetime reliability of an integrated circuit device with respect to one or more failure mechanisms includes breaking down the integrated circuit device into structures; breaking down each structure into elements and devices; evaluating each device to determine whether the device is vulnerable to the failure mechanisms and eliminating devices determined not to be vulnerable; estimating, for each determined vulnerable device, the impact of a failure of the device on the functionality of the specific element associated therewith, and classifying the failure into a fatal failure or a non-fatal failure, wherein a fatal failure causes the element employing the given device to fail; determining, for those devices whose failures are fatal, an effective stress degree and/or time; determining one or more of a failure rate and a probability of fatal failure for the devices, and aggregating the same across the structures and the failure mechanisms.
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Bose Pradip
Hu Zhigang
Rivers Jude A.
Shin Jeonghee
Zyuban Victor
Cantor & Colburn LLP
Desta Elias
International Business Machines - Corporation
Raymond Edward
Yamonaco Lisa M.
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