Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2006-09-12
2006-09-12
Fourson, George R. (Department: 2823)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
C438S781000, C438S693000, C438S694000, C257SE21580, C257SE21576, C216S038000
Reexamination Certificate
active
07105452
ABSTRACT:
The present invention provides a method of planarizing a substrate, the method including, forming, on the substrate, a patterned layer having a first shape associated therewith; and processing the patterned layer, with the first shape compensating for variations in the processing such that upon processing the patterned layer, the patterned layer comprises a substantially planar shape.
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Carter Michael D.
Fourson George R.
Molecular Imprints, Inc.
Pham Thanh V.
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