Method of performing parallel test on semiconductor devices...

Details Method of performing parallel test on semiconductor devices... Method of performing parallel test on semiconductor devices...

2008-09-09

2008-09-09

Nguyen, Vinh P (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

11330013

ABSTRACT:
Provided is a method of performing a parallel test on semiconductor devices, the method including coupling a power signal line to a set of at least two semiconductor devices through a switching device, performing at least one part of a parallel test on the set of semiconductor devices, and disconnecting a semiconductor device from the set in response to determining that the semiconductor device is defective as a result of the at least one part of the parallel test.

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English language abstract of Korean Publication No. 1998-028731.
English language abstract of Japanese Publication No. 10-221402.

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