Method of performing ion implantation

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices

Reexamination Certificate

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Details

C250S492100, C250S492200, C250S492300

Reexamination Certificate

active

08063389

ABSTRACT:
A method of performing an ion implantation is provided. A workpiece is installed in the ion implanter. A wafer is provided in a receiving space within an ion implanter. An ion beam is generated by an ion source of the ion implanter. The bombard of the ion beam is blocked and particles generated during or after conducting the step of generating the ion beam are collected by the workpiece.

REFERENCES:
patent: 5637879 (1997-06-01), Schueler
patent: 5895923 (1999-04-01), Blake
patent: 5998798 (1999-12-01), Halling et al.
patent: 6093456 (2000-07-01), England et al.
patent: 6525327 (2003-02-01), Mitchell et al.
patent: 6608316 (2003-08-01), Harrison
patent: 6723998 (2004-04-01), Bisson et al.
patent: 6858854 (2005-02-01), Keum et al.
patent: 7385207 (2008-06-01), Yoon
patent: 7429741 (2008-09-01), Park
patent: 7629597 (2009-12-01), Tao et al.
patent: 7683348 (2010-03-01), Lee et al.
patent: 2002/0030167 (2002-03-01), Liebert et al.
patent: 2004/0262532 (2004-12-01), Krueger
patent: 2005/0191409 (2005-09-01), Murrell et al.
patent: 2005/0223991 (2005-10-01), Walther et al.
patent: 2006/0289798 (2006-12-01), Cummings et al.
patent: 2007/0045568 (2007-03-01), Chen et al.
patent: 2008/0017811 (2008-01-01), Collart et al.
patent: 2008/0135776 (2008-06-01), Dzengeleski et al.

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