Method of passivating semiconductor device

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Passivating of surface

Reexamination Certificate

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C438S154000, C438S199000, C438S958000

Reexamination Certificate

active

07045376

ABSTRACT:
A method of passivating a semiconductor device with two types of transistors, e.g., NMOS and PMOS transistors, the semiconductor device is placed in a pressurized sealed chamber and at least two different passivating gases are introduced into the chamber. The two passivating gases can be selected to have one gas suitable for passivating PMOS transistors and the other gas suitable for NMOS transistors.

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patent: 6274490 (2001-08-01), Chyan et al.
patent: 6670289 (2003-12-01), Lane et al.
patent: 6723665 (2004-04-01), Tanabe et al.
patent: 2002/0020840 (2002-02-01), Nakajima
patent: 2004/0058560 (2004-03-01), Ranish et al.
S. Wolf and R.N. Tauber, Silicon Processing for the VLSI Era, vol. 1, Lattice Press, 1986, p. 145.

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